The XJ4810/XJ4810A semiconductor tube characteristic diagram instrument utilizes an oscilloscope to display various characteristic curves of semiconductor devices and measure their static parameters. This instrument features dual-cluster curve display and a bidirectional collector scanning circuit, allowing for comparative analysis of the characteristics of the semiconductor devices under test, facilitating the pairing of tubes or components. With an IR measurement capability of up to 200nA/div, and when equipped with an expansion device, the VC can reach 3KV. It can test the transmission characteristics of CMOS and TTL gate circuits, pair or test field-effect transistors, and test the characteristics of three-terminal voltage regulators.

Main features:

1. Output voltage range and current capacity